NEW PRODUCTS
FPD
Solar Cell
PCB
Semi-Conductor
Thick Dielectric Film thickness monitor
Metal Film Thickness monitor
Wafer AVI machine for OQA area
Wafer 2D_3D bumping inspection
Automated OM Station
NIR wafer AOI
Others
YMS-2020
Specification Table：
YMS-2020
Item
Specifications
MNT
Equipment Monitor
RDV
Remote Data Viewer
SPC
Statistical Process Control
RTT
Real-time Trend Tracer
OVC
Offline Video Classification
DCJA
Defect Code Judge Audit
YMS-2020
Specification
Table：
